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Harshit Agarwal
Associate Professor
Department of Electrical Engineering
agarwalh@iitj.ac.in (Work)
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Publications - 62
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Publications (62)
Publications (62)
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Articles
Analysis and Modeling of Temperature and Bias Dependence of Current Mismatch in Halo-Implanted MOSFETs
C. Gupta
,
S. Dey
,
Harshit Agarwal
,
...
,
Y.S. Chauhan
(6 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Articles
Modeling of advanced RF bulk FinFETs
P. Kushwaha
,
Harshit Agarwal
,
...
,
C. Hu
(12 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Articles
Designing 0.5 v 5-nm HP and 0.23 v 5-nm LP NC-FinFETs with Improved IOFF Sensitivity in Presence of Parasitic Capacitance
Harshit Agarwal
,
P. Kushwaha
,
...
,
C. Hu
(8 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Articles
New Mobility Model for Accurate Modeling of Transconductance in FDSOI MOSFETs
Y.-K. Lin
,
P. Kushwaha
,
...
,
Harshit Agarwal
,
...
,
C. Hu
(12 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Articles
Modeling of Induced Gate Thermal Noise Including Back-Bias Effect in FDSOI MOSFET
C.K. Dabhi
,
A. Dasgupta
,
...
,
Harshit Agarwal
,
...
,
Y.S. Chauhan
(6 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Articles
Engineering negative differential resistance in NCFETs for analog applications
Harshit Agarwal
,
P. Kushwaha
,
...
,
C. Hu
(9 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Articles
NCFET Design Considering Maximum Interface Electric Field
Harshit Agarwal
,
P. Kushwaha
,
...
,
C. Hu
(8 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Unified compact model for gate all around fets-nanosheets, nanowires, multi bridge channel MOSFETs
P. Kushwaha
,
J.P. Duarte
,
...
,
Harshit Agarwal
,
...
,
C. Hu
(9 authors)
2018 | TechConnect
Articles
Variation Caused by Spatial Distribution of Dielectric and Ferroelectric Grains in a Negative Capacitance Field-Effect Transistor
M.-Y. Kao
,
A.B. Sachid
,
...
,
Harshit Agarwal
,
...
,
C. Hu
(10 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Negative-Capacitance FinFETs: Numerical Simulation, Compact Modeling and Circuit Evaluation
J.P. Duarte
,
Y.-K. Lin
,
...
,
Harshit Agarwal
,
...
,
C. Hu
(12 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Conferences
A Unified Flicker Noise Model for FDSOI MOSFETs Including Back-bias Effect
P. Kushwaha
,
Harshit Agarwal
,
...
,
Y.S. Chauhan
(7 authors)
2018 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Modeling of flicker noise in quasi-ballistic devices
A. Dasgupta
,
Harshit Agarwal
,
...
,
Y.S. Chauhan
(4 authors)
2017 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Compact modeling of nonquasi-static effect in bulk MOSFETs for RF circuit design in sub-THz regime
N. Mohamed
,
Harshit Agarwal
,
...
,
Y.S. Chauhan
(4 authors)
2017 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Analysis and modeling of low frequency noise in presence of doping non-uniformity in MOSFETs
Harshit Agarwal
,
C. Gupta
,
...
,
K. Chan
(7 authors)
2017 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Analysis and modeling of capacitances in halo-implanted MOSFETs
C. Gupta
,
Harshit Agarwal
,
...
,
Y.S. Chauhan
(5 authors)
2017 | Institute of Electrical and Electronics Engineers Inc.
Articles
Modeling of Back-Gate Effects on Gate-Induced Drain Leakage and Gate Currents in UTB SOI MOSFETs
Y.-K. Lin
,
P. Kushwaha
,
Harshit Agarwal
,
...
,
C. Hu
(9 authors)
2017 | Institute of Electrical and Electronics Engineers Inc.
Articles
Compact Modeling Source-to-Drain Tunneling in Sub-10-nm GAA FinFET with Industry Standard Model
Y.-K. Lin
,
J.P. Duarte
,
...
,
Harshit Agarwal
,
...
,
C. Hu
(8 authors)
2017 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Impact of back plane doping on RF performance of FD-SOI transistor
C.K. Dabhi
,
P. Kushwaha
,
...
,
Harshit Agarwal
and
Y.S. Chauhan
(5 authors)
2017 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Analysis and modeling of zero-threshold voltage native devices with industry standard BSIM6 model
C. Gupta
,
Harshit Agarwal
,
...
,
Y.S. Chauhan
(6 authors)
2017 | Japan Society of Applied Physics
Articles
Anomalous Transconductance in Long Channel Halo Implanted MOSFETs: Analysis and Modeling
Harshit Agarwal
,
C. Gupta
,
...
,
Y.S. Chauhan
(6 authors)
2017 | Institute of Electrical and Electronics Engineers Inc.
Showing 21-40 of 62 results
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