—An efficient approach for modeling of time interval error (TIE) due to noise in power delivery networks (PDNs), for current-mode (CM) driver circuits, is presented. Semianalytical expressions relating the PDN noise and TIE are developed based on midpoint delays of the rising and falling edges of the differential signal. The validating examples with CM driver circuits designed in various technologies comparing both the proposed and conventional approaches demonstrate a significant speedup using the proposed approach. © 2017 IEEE.

Jai Narayan Tripathi

Department of Electrical Engineering

IIT Jodhpur

R. Achar

R. Malik

&ldquo;IIT Jodhpur is committed to impart quality education to facilitate the creation of qualified, competent and responsible human resources to meet the emerging technological challenges of the world. It is working towards creating an equitable learning platform that is positive, accessible and effective in the face of the modern societal and scientific advancements.

Flexibility in curriculum, in all its academic programs, encompassing elements of teaching, research, creativity, innovation and entrepreneurship is the most unique feature of IIT Jodhpur. The Department of Science and Technology (DST), under the National Mission on Cyber Physical Systems, has identified IIT Jodhpur as a Technology &amp; Innovation Hub in the area of Augmented Reality and Virtual Reality. The institute has also been nominated as the coordinator for the Jodhpur City and Knowledge Cluster by the Office of Principal Scientific Adviser, Government of India.

The sprawling 852-acre IIT Jodhpur campus is a majestic tribute to the deep-rooted diverse cultural heritage of the region. The campus is an architectural masterpiece, which is slated to become an international exemplar of sustainability with net-zero energy, and advanced water and waste management strategies.&rdquo;

Journal	Data powered by TypesetIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Publisher	Data powered by TypesetInstitute of Electrical and Electronics Engineers Inc.
ISSN	10638210