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Evidences for ambient oxidation of indium nitride quantum dots
T.N. Bhat, M.K. Rajpalke, B. Roul, , S.B. Krupanidhi, N. Sinha
Published in
2011
Volume: 248
   
Issue: 12
Pages: 2853 - 2856
Abstract
Investigations were carried out on the ambient condition oxidation of self-assembled, fairly uniform indium nitride (InN) quantum dots (QDs) fabricated on p-Si substrates. Incorporation of oxygen in to the outer shell of the QDs was confirmed by the results of transmission electron microscopy (TEM), X-ray photoemission spectroscopy (XPS). As a consequence, a weak emission at high energy (∼1.03eV) along with a free excitonic emission (0.8eV) was observed in the photoluminescence spectrum. The present results confirm the incorporation of oxygen into the lattice of the outer shell of InN QDs, affecting their emission properties. © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
About the journal
JournalPhysica Status Solidi (B) Basic Research
ISSN03701972