An efficient methodology for estimation of power supply induced jitter (PSIJ) in high-speed designs is presented. Semianalytical expressions for jitter are derived based on separating the large signal response and the small signal noise response and subsequently combining the results. Proposed simplified relations enable the designers to estimate the PSIJ based on a single bit simulation. Proposed methods are validated on several examples of voltage-mode driver circuits, designed in different technologies and in the presence of different types of noise sources. © 2011-2012 IEEE.

Jai Narayan Tripathi

Department of Electrical Engineering

IIT Jodhpur

R. Achar

R. Malik

&ldquo;IIT Jodhpur is committed to impart quality education to facilitate the creation of qualified, competent and responsible human resources to meet the emerging technological challenges of the world. It is working towards creating an equitable learning platform that is positive, accessible and effective in the face of the modern societal and scientific advancements.

Flexibility in curriculum, in all its academic programs, encompassing elements of teaching, research, creativity, innovation and entrepreneurship is the most unique feature of IIT Jodhpur. The Department of Science and Technology (DST), under the National Mission on Cyber Physical Systems, has identified IIT Jodhpur as a Technology &amp; Innovation Hub in the area of Augmented Reality and Virtual Reality. The institute has also been nominated as the coordinator for the Jodhpur City and Knowledge Cluster by the Office of Principal Scientific Adviser, Government of India.

The sprawling 852-acre IIT Jodhpur campus is a majestic tribute to the deep-rooted diverse cultural heritage of the region. The campus is an architectural masterpiece, which is slated to become an international exemplar of sustainability with net-zero energy, and advanced water and waste management strategies.&rdquo;

Journal	Data powered by TypesetIEEE Transactions on Components, Packaging and Manufacturing Technology
Publisher	Data powered by TypesetInstitute of Electrical and Electronics Engineers Inc.
ISSN	21563950