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Edge Probability and Pixel Relativity-Based Speckle Reducing Anisotropic Diffusion
D. Mishra, , M. Sarkar, A.S. Soin, V. Sharma
Published in Institute of Electrical and Electronics Engineers Inc.
2018
PMID: 29028196
Volume: 27
   
Issue: 2
Pages: 649 - 664
Abstract
Anisotropic diffusion filters are one of the best choices for speckle reduction in the ultrasound images. These filters control the diffusion flux flow using local image statistics and provide the desired speckle suppression. However, inefficient use of edge characteristics results in either oversmooth image or an image containing misinterpreted spurious edges. As a result, the diagnostic quality of the images becomes a concern. To alleviate such problems, a novel anisotropic diffusion-based speckle reducing filter is proposed in this paper. A probability density function of the edges along with pixel relativity information is used to control the diffusion flux flow. The probability density function helps in removing the spurious edges and the pixel relativity reduces the oversmoothing effects. Furthermore, the filtering is performed in superpixel domain to reduce the execution time, wherein a minimum of 15% of the total number of image pixels can be used. For performance evaluation, 31 frames of three synthetic images and 40 real ultrasound images are used. In most of the experiments, the proposed filter shows a better performance as compared to the state-of-the-art filters in terms of the speckle region's signal-to-noise ratio and mean square error. It also shows a comparative performance for figure of merit and structural similarity measure index. Furthermore, in the subjective evaluation, performed by the expert radiologists, the proposed filter's outputs are preferred for the improved contrast and sharpness of the object boundaries. Hence, the proposed filtering framework is suitable to reduce the unwanted speckle and improve the quality of the ultrasound images. © 2017 IEEE.
About the journal
JournalData powered by TypesetIEEE Transactions on Image Processing
PublisherData powered by TypesetInstitute of Electrical and Electronics Engineers Inc.
ISSN10577149