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Complete visual metrology using relative affine structure
A. Miglani, S.D. Roy, , J.B. Srivastava
Published in IEEE Computer Society
We propose a framework for retrieving metric information for repeated objects from single perspective image. Relative affine structure, which is an invariant, is directly proportional to the Euclidean distance of a three dimensional point from a reference plane. The proposed method is based on this fundamental concept. The first object undergoes 4 × 4 transformation and results in a repeated object. We represent this transformation in terms of three relative affine structures along X, Y and Z axes. Additionally, we propose the possible extension of this framework for motion analysis - structure from motion and motion segmentation. © 2013 IEEE.