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A simple and direct method for interface characterization of OFETs
P. Srinivas
,
Shree Prakash Tiwari
,
H.N. Raval
,
R.N. Ramesh
,
T. Cahyadi
,
S.G. Mhaisalkar
,
V.R. Rao
Published in
2007
DOI:
10.1109/IPFA.2007.4378107
Pages: 306 - 309
Topics:
Organic field-effect transistor
(56)%
56% related to the paper
,
Gate dielectric
(52)%
52% related to the paper
and
Pentacene
(52)%
52% related to the paper
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A Simple and Direct Method for Interface Characterization of OFETs
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Journal Details
Authors (1)
About the journal
Journal
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
Authors (1)
Shree Prakash Tiwari
Department of Electrical Engineering
IIT Jodhpur
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