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A simple and direct method for interface characterization of OFETs
P. Srinivas, , H.N. Raval, R.N. Ramesh, T. Cahyadi, S.G. Mhaisalkar, V.R. Rao
Published in
Pages: 306 - 309
About the journal
JournalProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA