X-ray photoemission measurements were performed on Au deposited on a Bi(2212) single crystal after progressively sputtering it with Ar ions. This was to see whether changes such as diffusion of Au, segregation of a particular element or clustering effects take place at the interface. Spectra of different core levels reveal no elemental diffusion at the interface and an absence of Au interaction with the crystal at room temperature.

Ajay Agrawal

Department of Electrical Engineering

IIT Jodhpur

P. Srivastava

N.L. Saini

B.R. Sekhar

S. Venkatesh

M. Khaled

S.K. Sharmat

K.B. Garg

R.P. Gupta

W.S. Khokle

&ldquo;IIT Jodhpur is committed to impart quality education to facilitate the creation of qualified, competent and responsible human resources to meet the emerging technological challenges of the world. It is working towards creating an equitable learning platform that is positive, accessible and effective in the face of the modern societal and scientific advancements.

Flexibility in curriculum, in all its academic programs, encompassing elements of teaching, research, creativity, innovation and entrepreneurship is the most unique feature of IIT Jodhpur. The Department of Science and Technology (DST), under the National Mission on Cyber Physical Systems, has identified IIT Jodhpur as a Technology &amp; Innovation Hub in the area of Augmented Reality and Virtual Reality. The institute has also been nominated as the coordinator for the Jodhpur City and Knowledge Cluster by the Office of Principal Scientific Adviser, Government of India.

The sprawling 852-acre IIT Jodhpur campus is a majestic tribute to the deep-rooted diverse cultural heritage of the region. The campus is an architectural masterpiece, which is slated to become an international exemplar of sustainability with net-zero energy, and advanced water and waste management strategies.&rdquo;

A photoemission study of the influence of sputtering on the Au-Bi(2212) interface

Superconductor Science and Technology

Journal	Superconductor Science and Technology
ISSN	09532048